68 Digital Arithmetic Circuits 31

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Part	Manufacturer	Logic IC Type	Temperature Grade	Terminal Form	No. of Terminals	Package Code	Package Shape	Package Body Material	Surface Mount	No. of Functions	Technology	No. of Bits	Nominal Supply Voltage / Vsup (V)	Load Capacitance (CL)	Package Style (Meter)	Package Equivalence Code	Propagation Delay (tpd)	Sub-Category	Terminal Pitch	Maximum Operating Temperature	Output Characteristics	Minimum Operating Temperature	Terminal Position	JESD-30 Code	Maximum Supply Voltage (Vsup)	Maximum Seated Height	Width	Qualification	Minimum Supply Voltage (Vsup)	Maximum Power Supply Current (ICC)	Additional Features	Maximum Time At Peak Reflow Temperature (s)	Peak Reflow Temperature (C)	Length	Family
SN54AS634FN	Texas Instruments	ERROR DETECTION AND CORRECTION CIRCUIT	MILITARY	J BEND	68	QCCJ	SQUARE	PLASTIC/EPOXY	YES	1	TTL	32	5		CHIP CARRIER				1.27 mm	125 Cel	3-STATE	-55 Cel	QUAD	S-PQCC-J68	5.5 V	4.57 mm	24.2316 mm	Not Qualified	4.5 V		BUILT IN DIAGNOSTICS			24.2316 mm	AS
SN54ALS632BFN	Texas Instruments	ERROR DETECTION AND CORRECTION CIRCUIT	MILITARY	J BEND	68	QCCJ	SQUARE	PLASTIC/EPOXY	YES	1	TTL	32	5		CHIP CARRIER				1.27 mm	125 Cel	3-STATE	-55 Cel	QUAD	S-PQCC-J68	5.5 V	4.57 mm	24.2316 mm	Not Qualified	4.5 V		BUILT IN DIAGNOSTICS; BYTE CONTROL			24.2316 mm	ALS
SNJ54AS634FN	Texas Instruments	ERROR DETECTION AND CORRECTION CIRCUIT	MILITARY	J BEND	68	QCCJ	SQUARE	PLASTIC/EPOXY	YES	1	TTL	32	5		CHIP CARRIER				1.27 mm	125 Cel	3-STATE	-55 Cel	QUAD	S-PQCC-J68	5.5 V	4.57 mm	24.2316 mm	Not Qualified	4.5 V		BUILT IN DIAGNOSTICS			24.2316 mm	AS
SNJ54ALS635FN	Texas Instruments	ERROR DETECTION AND CORRECTION CIRCUIT	MILITARY	J BEND	68	QCCJ	SQUARE	PLASTIC/EPOXY	YES	1	TTL	32	5	50 pF	CHIP CARRIER		65 ns		1.27 mm	125 Cel	OPEN-COLLECTOR	-55 Cel	QUAD	S-PQCC-J68	5.5 V	4.57 mm	24.2316 mm	Not Qualified	4.5 V		BUILT IN DIAGNOSTICS			24.2316 mm	ALS
SNJ54ALS633FN	Texas Instruments	ERROR DETECTION AND CORRECTION CIRCUIT	MILITARY	J BEND	68	QCCJ	SQUARE	PLASTIC/EPOXY	YES	1	TTL	32	5	50 pF	CHIP CARRIER		65 ns		1.27 mm	125 Cel	OPEN-COLLECTOR	-55 Cel	QUAD	S-PQCC-J68	5.5 V	4.57 mm	24.2316 mm	Not Qualified	4.5 V	250 mA	BUILT IN DIAGNOSTICS; BYTE CONTROL			24.2316 mm	ALS
SNJ54ALS632AFN	Texas Instruments	ERROR DETECTION AND CORRECTION CIRCUIT	MILITARY	J BEND	68	QCCJ	SQUARE	PLASTIC/EPOXY	YES	1	TTL	32	5	50 pF	CHIP CARRIER		65 ns		1.27 mm	125 Cel	3-STATE	-55 Cel	QUAD	S-PQCC-J68	5.5 V	4.57 mm	24.2316 mm	Not Qualified	4.5 V	250 mA	BUILT IN DIAGNOSTICS; BYTE CONTROL			24.2316 mm	ALS
SNJ54ALS634FN	Texas Instruments	ERROR DETECTION AND CORRECTION CIRCUIT	MILITARY	J BEND	68	QCCJ	SQUARE	PLASTIC/EPOXY	YES	1	TTL	32	5	50 pF	CHIP CARRIER		65 ns		1.27 mm	125 Cel	3-STATE	-55 Cel	QUAD	S-PQCC-J68	5.5 V	4.57 mm	24.2316 mm	Not Qualified	4.5 V	250 mA	BUILT IN DIAGNOSTICS			24.2316 mm	ALS
SN54ALS632AFN	Texas Instruments	ERROR DETECTION AND CORRECTION CIRCUIT	MILITARY	J BEND	68	QCCJ	SQUARE	PLASTIC/EPOXY	YES	1	TTL	32	5	50 pF	CHIP CARRIER		65 ns		1.27 mm	125 Cel	3-STATE	-55 Cel	QUAD	S-PQCC-J68	5.5 V	4.57 mm	24.2316 mm	Not Qualified	4.5 V	250 mA	BUILT IN DIAGNOSTICS; BYTE CONTROL			24.2316 mm	ALS
SNJ54ALS632BFN	Texas Instruments	ERROR DETECTION AND CORRECTION CIRCUIT	MILITARY	J BEND	68	QCCJ	SQUARE	PLASTIC/EPOXY	YES	1	TTL	32	5		CHIP CARRIER				1.27 mm	125 Cel	3-STATE	-55 Cel	QUAD	S-PQCC-J68	5.5 V	4.57 mm	24.2316 mm	Not Qualified	4.5 V		BUILT IN DIAGNOSTICS; BYTE CONTROL			24.2316 mm	ALS
SN54ALS635FN	Texas Instruments	ERROR DETECTION AND CORRECTION CIRCUIT	MILITARY	J BEND	68	QCCJ	SQUARE	PLASTIC/EPOXY	YES	1	TTL	32	5	50 pF	CHIP CARRIER		65 ns		1.27 mm	125 Cel	OPEN-COLLECTOR	-55 Cel	QUAD	S-PQCC-J68	5.5 V	4.57 mm	24.2316 mm	Not Qualified	4.5 V		BUILT IN DIAGNOSTICS			24.2316 mm	ALS
SN54ALS633FN	Texas Instruments	ERROR DETECTION AND CORRECTION CIRCUIT	MILITARY	J BEND	68	QCCJ	SQUARE	PLASTIC/EPOXY	YES	1	TTL	32	5	50 pF	CHIP CARRIER		65 ns		1.27 mm	125 Cel	OPEN-COLLECTOR	-55 Cel	QUAD	S-PQCC-J68	5.5 V	4.57 mm	24.2316 mm	Not Qualified	4.5 V	250 mA	BUILT IN DIAGNOSTICS; BYTE CONTROL			24.2316 mm	ALS
DP8402AV	Texas Instruments	ERROR DETECTION AND CORRECTION CIRCUIT	COMMERCIAL	J BEND	68	QCCJ	SQUARE	PLASTIC/EPOXY	YES	1		32	5		CHIP CARRIER		55 ns		1.27 mm	70 Cel	3-STATE	0 Cel	QUAD	S-PQCC-J68	5.5 V	4.57 mm	24.13 mm		4.5 V					24.13 mm	8402
SNJ54ALS634BFN	Texas Instruments	ERROR DETECTION AND CORRECTION CIRCUIT	MILITARY	J BEND	68	QCCJ	SQUARE	PLASTIC/EPOXY	YES	1	TTL	32	5		CHIP CARRIER				1.27 mm	125 Cel	3-STATE	-55 Cel	QUAD	S-PQCC-J68	5.5 V	4.57 mm	24.2316 mm	Not Qualified	4.5 V		BUILT IN DIAGNOSTICS			24.2316 mm	ALS
SN54ALS634BFN	Texas Instruments	ERROR DETECTION AND CORRECTION CIRCUIT	MILITARY	J BEND	68	QCCJ	SQUARE	PLASTIC/EPOXY	YES	1	TTL	32	5		CHIP CARRIER				1.27 mm	125 Cel	3-STATE	-55 Cel	QUAD	S-PQCC-J68	5.5 V	4.57 mm	24.2316 mm	Not Qualified	4.5 V		BUILT IN DIAGNOSTICS			24.2316 mm	ALS
SNJ54AS632FN	Texas Instruments	ERROR DETECTION AND CORRECTION CIRCUIT	MILITARY	J BEND	68	QCCJ	SQUARE	PLASTIC/EPOXY	YES	1	TTL	32	5		CHIP CARRIER				1.27 mm	125 Cel	3-STATE	-55 Cel	QUAD	S-PQCC-J68	5.5 V	4.57 mm	24.2316 mm	Not Qualified	4.5 V		BUILT IN DIAGNOSTICS; BYTE CONTROL			24.2316 mm	AS
SN54AS632FN	Texas Instruments	ERROR DETECTION AND CORRECTION CIRCUIT	MILITARY	J BEND	68	QCCJ	SQUARE	PLASTIC/EPOXY	YES	1	TTL	32	5		CHIP CARRIER				1.27 mm	125 Cel	3-STATE	-55 Cel	QUAD	S-PQCC-J68	5.5 V	4.57 mm	24.2316 mm	Not Qualified	4.5 V		BUILT IN DIAGNOSTICS; BYTE CONTROL			24.2316 mm	AS
SN54ALS634FN	Texas Instruments	ERROR DETECTION AND CORRECTION CIRCUIT	MILITARY	J BEND	68	QCCJ	SQUARE	PLASTIC/EPOXY	YES	1	TTL	32	5	50 pF	CHIP CARRIER		65 ns		1.27 mm	125 Cel	3-STATE	-55 Cel	QUAD	S-PQCC-J68	5.5 V	4.57 mm	24.2316 mm	Not Qualified	4.5 V	250 mA	BUILT IN DIAGNOSTICS			24.2316 mm	ALS
SN74ALS634AFN	Texas Instruments	ERROR DETECTION AND CORRECTION CIRCUIT	COMMERCIAL	J BEND	68	QCCJ	SQUARE	PLASTIC/EPOXY	YES		TTL				CHIP CARRIER	LDCC68,1.0SQ		Arithmetic Circuits	1.27 mm	70 Cel		0 Cel	QUAD	S-PQCC-J68				Not Qualified
SN74AS632FN	Texas Instruments	ERROR DETECTION AND CORRECTION CIRCUIT	COMMERCIAL	J BEND	68	QCCJ	SQUARE	PLASTIC/EPOXY	YES	1	TTL	32	5	50 pF	CHIP CARRIER	LDCC68,1.0SQ	32 ns	Arithmetic Circuits	1.27 mm	70 Cel	3-STATE	0 Cel	QUAD	S-PQCC-J68	5.5 V	4.57 mm	24.2316 mm	Not Qualified	4.5 V	300 mA	BUILT IN DIAGNOSTICS; BYTE CONTROL	NOT SPECIFIED	NOT SPECIFIED	24.2316 mm	AS
SN74AS632AFN	Texas Instruments	ERROR DETECTION AND CORRECTION CIRCUIT	COMMERCIAL	J BEND	68	QCCJ	SQUARE	PLASTIC/EPOXY	YES	1	TTL	32	5	50 pF	CHIP CARRIER	LDCC68,1.0SQ	24 ns	Arithmetic Circuits	1.27 mm	70 Cel	3-STATE	0 Cel	QUAD	S-PQCC-J68	5.5 V	4.57 mm	24.2316 mm	Not Qualified	4.5 V	330 mA	BUILT IN DIAGNOSTICS; BYTE CONTROL	NOT SPECIFIED	NOT SPECIFIED	24.2316 mm	AS
SN74ALS632BFN	Texas Instruments	ERROR DETECTION AND CORRECTION CIRCUIT	COMMERCIAL	J BEND	68	QCCJ	SQUARE	PLASTIC/EPOXY	YES	1	TTL	32	5	50 pF	CHIP CARRIER	LDCC68,1.0SQ	37 ns	Arithmetic Circuits	1.27 mm	70 Cel	3-STATE	0 Cel	QUAD	S-PQCC-J68	5.5 V	4.57 mm	24.2316 mm	Not Qualified	4.5 V	250 mA	BUILT IN DIAGNOSTICS; BYTE CONTROL	NOT SPECIFIED	NOT SPECIFIED	24.2316 mm	ALS
SN74AS632AFNR	Texas Instruments	ERROR DETECTION AND CORRECTION CIRCUIT	COMMERCIAL	J BEND	68	QCCJ	SQUARE	PLASTIC/EPOXY	YES	1	TTL	32	5	50 pF	CHIP CARRIER		24 ns		1.27 mm	70 Cel	3-STATE	0 Cel	QUAD	S-PQCC-J68	5.5 V	4.57 mm	24.2316 mm	Not Qualified	4.5 V	330 mA	BUILT IN DIAGNOSTICS; BYTE CONTROL			24.2316 mm	AS
SN74AS634FN	Texas Instruments	ERROR DETECTION AND CORRECTION CIRCUIT	COMMERCIAL	J BEND	68	QCCJ	SQUARE	PLASTIC/EPOXY	YES	1	TTL	32	5		CHIP CARRIER	LDCC68,1.0SQ		Arithmetic Circuits	1.27 mm	70 Cel	3-STATE	0 Cel	QUAD	S-PQCC-J68	5.5 V	4.57 mm	24.2316 mm	Not Qualified	4.5 V		BUILT IN DIAGNOSTICS	NOT SPECIFIED	NOT SPECIFIED	24.2316 mm	AS
SN74ALS633FN	Texas Instruments	ERROR DETECTION AND CORRECTION CIRCUIT	COMMERCIAL	J BEND	68	QCCJ	SQUARE	PLASTIC/EPOXY	YES	1	TTL	32	5	50 pF	CHIP CARRIER	LDCC68,1.0SQ	58 ns	Arithmetic Circuits	1.27 mm	70 Cel	OPEN-COLLECTOR	0 Cel	QUAD	S-PQCC-J68	5.5 V	4.57 mm	24.2316 mm	Not Qualified	4.5 V	250 mA	BUILT IN DIAGNOSTICS; BYTE CONTROL	NOT SPECIFIED	NOT SPECIFIED	24.2316 mm	ALS
SN74ALS634BFN	Texas Instruments	ERROR DETECTION AND CORRECTION CIRCUIT	COMMERCIAL	J BEND	68	QCCJ	SQUARE	PLASTIC/EPOXY	YES	1	TTL	32	5		CHIP CARRIER				1.27 mm	70 Cel	3-STATE	0 Cel	QUAD	S-PQCC-J68	5.5 V	4.57 mm	24.2316 mm	Not Qualified	4.5 V		BUILT IN DIAGNOSTICS			24.2316 mm	ALS
SN74ALS635FN	Texas Instruments	ERROR DETECTION AND CORRECTION CIRCUIT	COMMERCIAL	J BEND	68	QCCJ	SQUARE	PLASTIC/EPOXY	YES	1	TTL	32	5	50 pF	CHIP CARRIER	LDCC68,1.0SQ	58 ns	Arithmetic Circuits	1.27 mm	70 Cel	OPEN-COLLECTOR	0 Cel	QUAD	S-PQCC-J68	5.5 V	4.57 mm	24.2316 mm	Not Qualified	4.5 V		BUILT IN DIAGNOSTICS	NOT SPECIFIED	NOT SPECIFIED	24.2316 mm	ALS
SN74ALS634FN	Texas Instruments	ERROR DETECTION AND CORRECTION CIRCUIT	COMMERCIAL	J BEND	68	QCCJ	SQUARE	PLASTIC/EPOXY	YES	1	TTL	32	5	50 pF	CHIP CARRIER	LDCC68,1.0SQ	58 ns	Arithmetic Circuits	1.27 mm	70 Cel	3-STATE	0 Cel	QUAD	S-PQCC-J68	5.5 V	4.57 mm	24.2316 mm	Not Qualified	4.5 V	250 mA	BUILT IN DIAGNOSTICS	NOT SPECIFIED	NOT SPECIFIED	24.2316 mm	ALS
SN74ALS632BFNR	Texas Instruments	ERROR DETECTION AND CORRECTION CIRCUIT	COMMERCIAL	J BEND	68	QCCJ	SQUARE	PLASTIC/EPOXY	YES	1	TTL	32	5	50 pF	CHIP CARRIER		37 ns		1.27 mm	70 Cel	3-STATE	0 Cel	QUAD	S-PQCC-J68	5.5 V	4.57 mm	24.2316 mm	Not Qualified	4.5 V	250 mA	BUILT IN DIAGNOSTICS; BYTE CONTROL			24.2316 mm	ALS
SN74AS632FNR	Texas Instruments	ERROR DETECTION AND CORRECTION CIRCUIT	COMMERCIAL	J BEND	68	QCCJ	SQUARE	PLASTIC/EPOXY	YES	1	TTL	32	5	50 pF	CHIP CARRIER		32 ns		1.27 mm	70 Cel	3-STATE	0 Cel	QUAD	S-PQCC-J68	5.5 V	4.57 mm	24.2316 mm	Not Qualified	4.5 V	300 mA	BUILT IN DIAGNOSTICS; BYTE CONTROL			24.2316 mm	AS
SN74ALS632AFN	Texas Instruments	ERROR DETECTION AND CORRECTION CIRCUIT	COMMERCIAL	J BEND	68	QCCJ	SQUARE	PLASTIC/EPOXY	YES	1	TTL	32	5	50 pF	CHIP CARRIER	LDCC68,1.0SQ	58 ns	Arithmetic Circuits	1.27 mm	70 Cel	3-STATE	0 Cel	QUAD	S-PQCC-J68	5.5 V	4.57 mm	24.2316 mm	Not Qualified	4.5 V	250 mA	BUILT IN DIAGNOSTICS; BYTE CONTROL	NOT SPECIFIED	NOT SPECIFIED	24.2316 mm	ALS
SN74AS897GB	Texas Instruments	SHIFTER	COMMERCIAL	PIN/PEG	68	PGA	SQUARE	CERAMIC	NO		TTL				GRID ARRAY	PGA68,11X11		Arithmetic Circuits	2.54 mm	70 Cel		0 Cel	PERPENDICULAR	S-XPGA-P68				Not Qualified

Digital Arithmetic Circuits

Digital arithmetic circuits are electronic circuits designed to perform arithmetic operations on digital signals. These circuits are essential components of digital systems, such as microprocessors, digital signal processors, and programmable logic devices.

Digital arithmetic circuits can perform various arithmetic operations, including addition, subtraction, multiplication, division, and modulo arithmetic. These operations are performed using binary arithmetic, where numbers are represented using the binary number system (0s and 1s).

Adders are one of the most commonly used digital arithmetic circuits. They are used to perform binary addition, where two binary numbers are added to produce a sum. Adders can be designed using various techniques, including ripple carry adders, carry look-ahead adders, and carry select adders.

Subtractors are also commonly used digital arithmetic circuits. They are used to perform binary subtraction, where one binary number is subtracted from another to produce a difference. Subtractors can be designed using techniques, including ripple borrow subtractors, borrow look-ahead subtractors, and borrow select subtractors.

Multiplexers and demultiplexers are digital circuits that can be used for various arithmetic operations, such as multiplication and division. Multiplexers can be used to select one of several input signals based on a control signal, while demultiplexers can be used to distribute a single input signal to several outputs based on a control signal.

Digital arithmetic circuits can also be designed using programmable logic devices, such as field-programmable gate arrays (FPGAs) and complex programmable logic devices (CPLDs). These devices can be programmed to implement various arithmetic operations and can be reprogrammed to adapt to changing system requirements.