Texas Instruments - TIBPALT19R6CFN

  1. Home
  2. Texas Instruments - TIBPALT19R6CFN
TIBPALT19R6CFN by Texas Instruments

Image shown is a representation only.

Manufacturer Texas Instruments
Manufacturer's Part Number TIBPALT19R6CFN
Description OT PLD; Grading Of Temperature: COMMERCIAL; Form Of Terminal: J BEND; No. of Terminals: 28; Package Code: QCCJ; Package Shape: SQUARE;
Datasheet TIBPALT19R6CFN Datasheet
In Stock4,897
NAME DESCRIPTION
Minimum Supply Voltage: 4.75 V
Package Body Material: Plastic/Epoxy
Propagation Delay: 25 ns
Organization: 0 Dedicated Inputs, 2 I/O
Maximum Seated Height: 4.57 mm
No. of Inputs: 19
Sub-Category: Programmable Logic Devices
Surface Mount: Yes
No. of Outputs: 8
Position Of Terminal: Quad
No. of Terminals: 28
No. of I/O Lines: 2
Package Style (Meter): Chip Carrier
JESD-30 Code: S-PQCC-J28
Maximum Clock Frequency: 30 MHz
Package Shape: Square
Maximum Operating Temperature: 70 °C (158 °F)
Package Code: QCCJ
Width: 11.5062 mm
No. of Dedicated Inputs: 0
Grading Of Temperature: Commercial
Programmable IC Type: OT PLD
Maximum Supply Voltage: 5.25 V
Architecture: PAL-TYPE
No. of Product Terms: 64
Nominal Supply Voltage (V): 5
Technology Used: TTL
Minimum Operating Temperature: 0 °C (32 °F)
Qualification: No
Package Equivalence Code: LDCC28,.5SQ
Length: 11.5062 mm
Form Of Terminal: J Bend
Additional Features: 1 External Clock; Register Preload
Output Function: Mixed
Pitch Of Terminal: 1.27 mm
Power Supplies (V): 5 V
Plant 5!
Your quote plants 5 trees.

Pricing (USD)

Qty. Unit Price Ext. Price
4,897 - -

Popular Products

Category Top Products

LC4064V-75TN44C by Lattice Semiconductor

LC4064V-75TN44C

Lattice Semiconductor

LC4064V-75TN44C by Lattice Semiconductor is a 3.3V EE PLD with 64 macro cells, 32 inputs, and 30 I/O lines. With a propagation delay of 7.5 ns and max clock frequency of 111 MHz, it's ideal for applications requiring fast processing speeds in programmable logic devices. The device is surface mountable and features JTAG boundary scan test capability for efficient testing processes.
5M40ZE64C5N by Altera

5M40ZE64C5N

Altera

FLASH PLD; Grading Of Temperature: OTHER; Form Of Terminal: GULL WING; No. of Terminals: 64; Package Code: HTFQFP; Package Shape: SQUARE;
EPM7192SQC160-10N by Intel

EPM7192SQC160-10N

Intel

EPM7192SQC160-10N by Intel is a 192 macrocell EE PLD with 10 ns propagation delay, operating at up to 125 MHz. It features in-system programmability and is ideal for applications requiring high-speed digital logic functions. The device has a square package shape, flatpack style, and Gull Wing terminals for easy surface mounting.
EPF10K30ATC144-3N by Intel

EPF10K30ATC144-3N

Intel

EPF10K30ATC144-3N by Intel is a PLD with 1728 logic cells, 0.9 ns propagation delay, and 102 inputs. It operates at a max frequency of 80 MHz and is ideal for applications requiring high-speed processing in commercial environments. With a low profile package style and fine pitch terminals, it offers versatility in design while maintaining reliable performance.
LC4256V-10TN176I by Lattice Semiconductor

LC4256V-10TN176I

Lattice Semiconductor

LC4256V-10TN176I by Lattice Semiconductor is a 3.3V EE PLD with 256 macro cells and 132 inputs. With a propagation delay of 10ns, it supports an 86MHz clock frequency. Ideal for applications requiring high-speed processing and programmable logic in compact form factors.
ATF16V8B-15PU by Atmel

ATF16V8B-15PU

Atmel

FLASH PLD; Grading Of Temperature: INDUSTRIAL; Form Of Terminal: THROUGH-HOLE; No. of Terminals: 20; Package Code: DIP; Package Shape: RECTANGULAR;
LC4032ZC-5TN48C by Lattice Semiconductor

LC4032ZC-5TN48C

Lattice Semiconductor

LC4032ZC-5TN48C by Lattice Semiconductor is a 32 macrocell EE PLD with 36 inputs and 32 outputs. It has a propagation delay of 5 ns, operates at max clock frequency of 156 MHz, and supports JTAG boundary scan test. Ideal for applications requiring in-system programmability and high-speed digital logic functions.
EPM3064ATC100-10N by Altera

EPM3064ATC100-10N

Altera

The Altera EPM3064ATC100-10N is a programmable logic device with a maximum clock frequency of 100 MHz and 66 I/O lines. It has a propagation delay of 10 ns and operates on a nominal supply voltage of 3.3 V. This PLD is commonly used for applications requiring in-system programmability and macrocell output functions.
EPM1270F256I5N by Altera

EPM1270F256I5N

Altera

The EPM1270F256I5N by Altera is a programmable logic device with 980 macro cells. It has a maximum supply voltage of 2.625V and uses CMOS technology. It is a flash PLD that is in-system programmable. The package style is grid array, with 256 terminals. Its top application is as a macrocell output function.
5M570ZT144I5N by Intel

5M570ZT144I5N

Intel

The Intel 5M570ZT144I5N is a FLASH PLD with 440 macro cells, operating at a max clock frequency of 118.3 MHz. With in-system programmability and JTAG boundary scan test support, it is ideal for industrial applications requiring high-speed processing and versatile I/O configurations.
LC4256V-75TN144E by Lattice Semiconductor

LC4256V-75TN144E

Lattice Semiconductor

LC4256V-75TN144E by Lattice Semiconductor is a 256 macrocell EE PLD with 110 inputs and 96 I/O lines. Featuring a propagation delay of 7.5 ns, it operates at a max clock frequency of 111 MHz. Ideal for applications requiring in-system programmability and JTAG boundary scan testing in compact designs.
XC2C64A-7VQ100I by Xilinx

XC2C64A-7VQ100I

Xilinx

XC2C64A-7VQ100I by Xilinx is a 64 macrocell FLASH PLD with 7.5 ns propagation delay, operating at up to 200 MHz. Ideal for industrial applications, it features in-system programmability and 64 I/O lines, packaged in a thin profile square shape with gull wing terminals.
EPM7128AETC100-10N by Intel

EPM7128AETC100-10N

Intel

Intel's EPM7128AETC100-10N is a 128 macrocell EE PLD with 10ns propagation delay, operating at max 98MHz clock frequency. Ideal for applications requiring in-system programmability and output function from macrocells. Features include CMOS technology, 3.6V supply voltage, and JTAG boundary scan test capability.
EPM2210F324C5N by Intel

EPM2210F324C5N

Intel

The Intel EPM2210F324C5N is a FLASH PLD with 1700 macro cells, 272 inputs/outputs, and 11.2 ns propagation delay. It is used in applications requiring programmable logic devices with fast response times and high I/O capabilities. The device features a grid array package style and JTAG boundary scan test for efficient testing and integration into electronic systems.
EPM570ZM100C6N by Altera

EPM570ZM100C6N

Altera

FLASH PLD; Grading Of Temperature: OTHER; Form Of Terminal: BALL; No. of Terminals: 100; Package Code: BGA; Package Shape: SQUARE;
XC9572XL-7VQG64I by Xilinx

XC9572XL-7VQG64I

Xilinx

Xilinx XC9572XL-7VQG64I is a 3.3V programmable IC with 72 macro cells, 36 inputs/outputs, and 125MHz clock frequency. Ideal for industrial applications requiring in-system programmability and JTAG boundary scan testing in a compact square package with gull wing terminals.
EPM2210F256C5N by Altera

EPM2210F256C5N

Altera

FLASH PLD; Grading Of Temperature: OTHER; Form Of Terminal: BALL; No. of Terminals: 256; Package Code: BGA; Package Shape: SQUARE;
XA2C64A-7VQG44I by Xilinx

XA2C64A-7VQG44I

Xilinx

XA2C64A-7VQG44I by Xilinx is a 64 Macrocell FLASH PLD with 7.5 ns Propagation Delay, suitable for industrial applications. It operates at a voltage range of 1.7-1.9 V, has 33 I/O lines, and supports JTAG Boundary Scan Test for efficient debugging and testing processes.
EPM7128STC100-15 by Intel

EPM7128STC100-15

Intel

EPM7128STC100-15 by Intel is a 128 macrocell EE PLD with 84 I/O lines, in-system programmable with JTAG boundary scan test. It operates at a max clock frequency of 100 MHz and has a propagation delay of 15 ns. Ideal for applications requiring fast processing speeds and high I/O capabilities.
EPM7128SQC100-15N by Intel

EPM7128SQC100-15N

Intel

EPM7128SQC100-15N by Intel is a 128 macrocell EE PLD with 84 I/O lines, operating at up to 100 MHz. It features a propagation delay of 15 ns and can be used for applications requiring in-system programmability and JTAG boundary scan testing.