48 FRAMs 8

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Part RoHS Manufacturer Memory IC Type No. of Terminals Package Code Package Shape Total Dose (V) Package Body Material Surface Mount No. of Functions Technology Screening Level Terminal Form Parallel or Serial Operating Mode Maximum Supply Current No. of Words Nominal Supply Voltage / Vsup (V) Power Supplies (V) Memory Width Package Style (Meter) Package Equivalence Code Sub-Category Minimum Data Retention Time Terminal Pitch Maximum Operating Temperature Organization No. of Words Code Minimum Standby Voltage Minimum Operating Temperature Terminal Finish Terminal Position Write Protection JESD-30 Code Moisture Sensitivity Level (MSL) Maximum Supply Voltage (Vsup) Maximum Seated Height Endurance Maximum Clock Frequency (fCLK) Width Qualification Serial Bus Type Memory Density Minimum Supply Voltage (Vsup) Additional Features JESD-609 Code Maximum Time At Peak Reflow Temperature (s) Peak Reflow Temperature (C) Maximum Standby Current Length Maximum Access Time

MB85R1001ANC-GE1

Fujitsu

FRAM

48

TSOP1

RECTANGULAR

PLASTIC/EPOXY

YES

1

CMOS

GULL WING

PARALLEL

ASYNCHRONOUS

15 mA

131072 words

3.3

8

SMALL OUTLINE, THIN PROFILE

TSSOP48,.55,20

10

.5 mm

85 Cel

128KX8

128K

3 V

-40 Cel

DUAL

R-PDSO-G48

3.6 V

1.2 mm

10000000000 Write/Erase Cycles

12 mm

1048576 bit

3 V

DATA RETENTION TIME @ 55 DEGREE CENTIGRADE

.00005 Amp

12.4 mm

MB85R1001PFTN-GE1

Fujitsu

FRAM

48

TSOP1

RECTANGULAR

PLASTIC/EPOXY

YES

1

CMOS

GULL WING

PARALLEL

ASYNCHRONOUS

15 mA

131072 words

3.3

8

SMALL OUTLINE, THIN PROFILE

TSSOP48,.55,20

10

.5 mm

85 Cel

128KX8

128K

-40 Cel

DUAL

R-PDSO-G48

3.6 V

1.2 mm

10000000000 Write/Erase Cycles

12 mm

1048576 bit

3 V

DATA RETENTION TIME @ 55 DEGREE CENTIGRADE

.00005 Amp

12.4 mm

MB85R4002ANC-GE1

Fujitsu

FRAM

48

TSOP1

RECTANGULAR

PLASTIC/EPOXY

YES

1

CMOS

GULL WING

PARALLEL

ASYNCHRONOUS

20 mA

262144 words

3.3

16

SMALL OUTLINE, THIN PROFILE

TSSOP48,.55,20

10

.5 mm

85 Cel

256KX16

256K

3 V

-40 Cel

DUAL

R-PDSO-G48

3.6 V

1.2 mm

10000000000 Write/Erase Cycles

12 mm

4194304 bit

3 V

DATA RETENTION TIME @ 55 DEGREE CENTIGRADE

.00015 Amp

12.4 mm

FM21LD16-60-BG

Cypress Semiconductor

FRAM

48

TFBGA

RECTANGULAR

PLASTIC/EPOXY

YES

1

CMOS

BALL

PARALLEL

ASYNCHRONOUS

12 mA

131072 words

3.3

3/3.3

16

GRID ARRAY, THIN PROFILE, FINE PITCH

BGA48,6X8,30

SRAMs

10

.75 mm

85 Cel

128KX16

128K

2.7 V

-40 Cel

TIN SILVER COPPER

BOTTOM

R-PBGA-B48

3

3.6 V

1.2 mm

100000000000000 Write/Erase Cycles

6 mm

Not Qualified

2097152 bit

2.7 V

DATA RETENTION TIME @ 85 DEGREE CENTIGRADE;2.5KV ESD AVAILABLE;ALSO CONFIGURABLE AS 256KX8

e1

260

.00027 Amp

8 mm

110 ns

FM22LD16-55-BGTR

Infineon Technologies

FRAM

48

TFBGA

RECTANGULAR

PLASTIC/EPOXY

YES

1

CMOS

BALL

PARALLEL

ASYNCHRONOUS

12 mA

262144 words

3.3

16

GRID ARRAY, THIN PROFILE, FINE PITCH

BGA48,6X8,30

10

.75 mm

85 Cel

256KX16

256K

-40 Cel

TIN SILVER COPPER

BOTTOM

SOFTWARE

R-PBGA-B48

3

3.6 V

1.2 mm

100000000000000 Write/Erase Cycles

6 mm

4194304 bit

2.7 V

e1

260

.00027 Amp

8 mm

110 ns

FM22LD16-55-BG

Infineon Technologies

FRAM

48

TFBGA

RECTANGULAR

PLASTIC/EPOXY

YES

1

CMOS

BALL

PARALLEL

ASYNCHRONOUS

12 mA

262144 words

3.3

16

GRID ARRAY, THIN PROFILE, FINE PITCH

BGA48,6X8,30

10

.75 mm

85 Cel

256KX16

256K

-40 Cel

TIN SILVER COPPER

BOTTOM

SOFTWARE

R-PBGA-B48

3

3.6 V

1.2 mm

100000000000000 Write/Erase Cycles

6 mm

4194304 bit

2.7 V

e1

260

.00027 Amp

8 mm

110 ns

FM28V102-BG

Infineon Technologies

FRAM

48

TFBGA

RECTANGULAR

PLASTIC/EPOXY

YES

1

CMOS

BALL

PARALLEL

ASYNCHRONOUS

12 mA

65536 words

3.3

2.5/3.3

16

GRID ARRAY, THIN PROFILE, FINE PITCH

BGA48,6X8,30

SRAMs

10

.75 mm

85 Cel

64KX16

64K

2 V

-40 Cel

TIN SILVER COPPER

BOTTOM

R-PBGA-B48

3

3.6 V

1.2 mm

100000000000000 Write/Erase Cycles

6 mm

Not Qualified

1048576 bit

2 V

4KV ESD AVAILABLE

e1

.00025 Amp

8 mm

105 ns

FM28V202-BG

Infineon Technologies

FRAM

48

TFBGA

RECTANGULAR

PLASTIC/EPOXY

YES

1

CMOS

BALL

PARALLEL

ASYNCHRONOUS

12 mA

131072 words

3.3

16

GRID ARRAY, THIN PROFILE, FINE PITCH

BGA48,6X8,30

10

.75 mm

85 Cel

128KX16

128K

2 V

-40 Cel

TIN SILVER COPPER

BOTTOM

R-PBGA-B48

3

3.6 V

1.2 mm

100000000000000 Write/Erase Cycles

6 mm

2097152 bit

2 V

e1

.00025 Amp

8 mm

105 ns

FRAMs

Ferroelectric Random-Access Memories (or FRAMs), are a type of non-volatile memory technology that combines the advantages of both traditional dynamic random-access memory (DRAM) and non-volatile memory (NVRAM) technologies. FRAMs store data using a ferroelectric material, which has the unique property of being able to retain data even when the power is removed.

FRAMs are used in a variety of fields, including industrial automation, automotive systems, smart meters, and more, where their combination of non-volatility, speed, and endurance can be advantageous. While they may not be as prevalent as other memory types like Flash or DRAM, FRAMs offer a unique set of features that make them suitable for specific use cases.

Here are some key features and characteristics of FRAMs:

Non-Volatile: FRAMs are non-volatile, meaning they can retain data even when the power supply is turned off. This is in contrast to traditional DRAM, which is volatile and loses data when power is removed.

Fast Write Speeds: FRAMs offer very fast write speeds, comparable to DRAM. This makes them suitable for applications where high-speed write operations are required.

Low Power Consumption: FRAMs typically consume less power than other non-volatile memory technologies like Flash memory. This makes them suitable for battery-powered devices and applications where power efficiency is critical.

High Endurance: FRAMs have a high endurance, meaning they can withstand a large number of write cycles without degrading. This is in contrast to some Flash memory technologies that have limited write endurance.

Bit-Addressable: FRAMs are bit-addressable, which means you can read or write individual bits of data. This granularity is useful in applications where precise control over specific data is required.

Radiation Resistance: FRAMs are resistant to radiation, which makes them suitable for use in aerospace and other high-radiation environments.

Limited Density: One limitation of FRAM technology is that it has historically had lower storage density compared to other non-volatile memory technologies like Flash. However, advancements in FRAM technology have been made to increase storage capacity.